Optical Microscope

Principle:

Sample surfaces can be analyzed using reflection mode, while the structure of materials can be studied using transmitted light (samples must be a few micrometers thick). A large variety of contrast modes exist to highlight different aspects of material structures, depending on the information needed.

Capabilities:

Multiple function analysis including but not limited as surface structure, flow mark, orientation/distribution of fillers, flash, defect analysis, etc.

Asset:

Keyence VHX-7000 system:

Observation of samples at higher magnifications (x20-x200,X200–X2000) in reflection or transmission, and digital camera. External handheld lens (x20-x200) for special samples.


Preparative Techniques:

Polisher: Struers LaboPol-5

Polishing machine equipped with an autosampler, to prepare embedded sections and surfaces, with a finish at 1 µm.

Sinpa Projector_Shrinkage test

Owner: Mengjun Guo

Principle:

Compare the dimensions of the mold and the color chips, and calculate the shrinkage of the sample.

Capabilities:

Support molding processing

Asset:

JVB250

Sample requirements: Color Chips*10

Color chips dimension:

60*60*2; 80*80*2; 80*80*1(mm)

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