Sample surface can be analyzed using reflection mode, while the structure of materials can be studied using transmitted light (samples must be few microns thick). 

A large variety of contrast modes exist to highlight different aspects of material structures, depending on the information needed.

Samples can be either solids or liquids.

• Fractography
• Dispersion in polymer blends
• Powders, crystal morphologies
• Thickness measurements of multilayered materials, concentricity

• Deformulation of a surgical mask