Principle

Scanning Electron Microscopy enables the investigation of a sample over a wide range of scales, going from a few tenths of a nm up to several hundreds of micrometers.

Analysis of morphology, size, microstructure and texture.

In a SEM, it is also possible to perform an elemental analysis by collecting characteristic X-Rays, (EDS Energy Dispersive Spectroscopy).


Capabilities

  • Defect and contamination analysis
  • Morphology and chemical homogeneity of finely divided materials such as colloids, latexs or powders
  • Morphology of immiscible polymer blends
  • Identification of pigments, fillers, toughening agents and other additives in a compound – Dispersion analysis
  • Study of polymeric materials damage and failure
  • Investigation of corrosion processes
  • Coating characterization

Assets


AssetDetails

SEM Zeiss SUPRA 35

Scanning electron microscope with a field emission gun, resolution of a few nm, for observations of conductive samples in high vacuum.

It is equipped with an EDS probe for X Ray analysis.

SEM Jeol JSM7610-F

Scanning electron microscope with a field emission gun, resolution of a few nm, for observations of conductive samples in high vacuum.

It is equipped with an EDS probe for X Ray analysis.


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