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Principle

Sample surface can be analyzed using reflection mode, while the structure of materials can be studied using transmitted light (samples must be few microns thick). 

A large variety of contrast modes exist to highlight different aspects of material structures, depending on the information needed.

Samples can be either solids or liquids.

Capabilities

  • Fractography
  • Dispersion in polymer blends
  • Powders, crystal morphologies
  • Thickness measurements of multilayered materials, concentricity

Assets


AssetDetails

Stereo Microscope Leica M60

Observation of surface at low magnifications (x6-x40) in reflection, with integrated annular light and digital camera.


Zeiss Discovery V12

Observation of surface at low magnifications (x6-x40) in reflection, with integrated annular light and digital camera.

Optical Microscope Leica DM2700M

Observation of samples at higher magnifications (x25-x500, limit of resolution 0,5 µm) in reflection or transmission, and digital camera.

Preparative Techniques


AssetDetails

Polishing machine Struers Labopol-30

Polishing machine equipped with an autosampler, to prepare embedded sections and surfaces, with a finish at 0,25 µm.

Microtomy

Microtome to prepare cuts of samples, at room temperature, with a thickness in the range 0,5-50 µm.


Cryofracture

Fracture of frozen of samples in liquid nitrogen (-196°C), to prepare sections of soft samples.

Application Case Study

Deformulation of a surgical mask



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