Dielectric Spectroscopy at Low Frequency

This measurement employs the parallel plate method to evaluate the dielectric constant and dielectric loss of the material.  The sample is placed between the two electrodes of the dielectric test fixture (Agilent 16451B). An LCR meter is connected to the test fixture to measure the capacitance and resistance of the sample to calculate the dielectric constant and dielectric loss. 

Technology: LCR Meter

Equipment: Agilent 4284A (20 Hz ~ 1 MHz)

                   Agilent 4285A (75 kHz ~ 30 MHz)

                   Keysight E4980A (20 Hz ~ 2 MHz)

Test fixture: Agilent 16451B

Frequency Range: 20 Hz ~ 30 MHz

Standards: ASTM D150

Sample Size: thickness <= 10 mm, diameter: 10~56 mm