This measurement employs the parallel plate method to evaluate the dielectric constant and dielectric loss of the material. The sample is placed between the two electrodes of the dielectric test fixture (Agilent 16451B). An LCR meter is connected to the test fixture to measure the capacitance and resistance of the sample to calculate the dielectric constant and dielectric loss.
| Equipment | Image | Frequency Range | Standards | Sample Size | Lab Location |
|---|---|---|---|---|---|
| Agilent 4284A LCR Meter |
| 20 Hz ~ 1 MHz | ASTM D150 | Thickness <= 10 mm Diameter: 10~56 mm | PCL/ADL Alpharetta |
Agilent 4285A LCR Meter |
| 75 kHz ~ 30 MHz | PCL/ADL Alpharetta | ||
Keysight E4980A LCR Meter |
| 20 Hz ~ 2 MHz | PCL/ADL Alpharetta | ||
| Agilent 16451B Dielectric Test Fixture |
| <= 30 MHz | PCL/ADL Alpharetta |
