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Principle: | Sample surfaces can be analyzed using reflection mode, while the structure of materials can be studied using transmitted light (samples must be a few micrometers thick). A large variety of contrast modes exist to highlight different aspects of material structures, depending on the information needed. |
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Capabilities: | Multiple function analysis including but not limited as surface structure, flow mark, orientation/distribution of fillers, flash, defect analysis, etc. |
Asset: | | Keyence VHX-7000 system:Observation of samples at higher magnifications (x20-x200,X200–X2000) in reflection or transmission, and digital camera. External handheld lens(x20-x200) for special samples.
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Preparative Techniques: | | Polisher: Struers LaboPol-5Polishing machine equipped with an autosampler, to prepare embedded sections and surfaces, with a finish at 1 µm. |
Sinpa Projector_Shrinkage test
Principle: | Compare the dimensions of the mold and the color chips, and calculate the shrinkage of the sample. |
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Capabilities: | Support molding processing |
Asset: | | JVB250Sample requirements: Color Chips*10 Color chips dimension: 60*60*2; 80*80*2; 80*80*1(mm) |