| APPLICATIONS |
|---|
THEORY, KNOWLEDGE, & MODELS |
|---|
| CAPABILITIES |
|---|
| Theory | Patterning | Photolithography |
| Process | Coating | |
| UV exposure | ||
| Develop | ||
| Materials | ||
| Core Equipment at ADL Ewha site |
|---|
| 1. Spin coating on Substrate |
| 2. Mask Alignment and UV Exposure |
| 3. Develop |
| Core Competitiveness at ADL Ewha |
|---|
| Evaluation Data Library |
|---|
| Current Project Introduction |
|---|
| 2. Coating and Patternability Evaluation | |
| 3. Analysis and Reliability Testing |
| Commercialized Products | AZ series, JSR Series |
|---|---|
| Customized Products |
| No | Project Title |
|---|---|
| 1 | Photo Sensitive PI development at Ewha ADL Team |
| 2 | |
| 3 |